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Principles of semiconductor network testing /

Main Author:	Afshar, Amir.
Format:	Book
Language:	English
Published:	Boston : Butterworth-Heinemann, ©1995.
Subjects:	Integrated circuits > Testing. Semiconductors > Testing. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated. TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Online Access:	http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=205737

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