Holdings: 13th IEEE VLSI Test Symposium :

Corporate Authors:	IEEE VLSI Test Symposium Princeton, N.J.), IEEE Computer Society, IEEE Computer Society. Test Technology Technical Committee, Institution of Electrical and Electronics Engineers. Philadelphia Section
Format:	Book
Language:	English
Published:	Los Alamitos, Calif.: IEEE Computer Society Press, c1995
Subjects:	Integrated circuits > Very large scale integration > Testing

Βιβλιοθήκη	Ταξιθετικός αριθμός	Αριθμός Αντιτύπων	Πληροφορίες	Κατάσταση
Δημοκρίτειο Πανεπιστήμιο Θράκης	TK 7874	1	Προβολή	OPAC