Description: 13th IEEE VLSI Test Symposium :

Corporate Authors:	IEEE VLSI Test Symposium Princeton, N.J.), IEEE Computer Society, IEEE Computer Society. Test Technology Technical Committee, Institution of Electrical and Electronics Engineers. Philadelphia Section
Format:	Book
Language:	English
Published:	Los Alamitos, Calif.: IEEE Computer Society Press, c1995
Subjects:	Integrated circuits > Very large scale integration > Testing

Physical Description:	xx, 493 σ. : εικ. ; 28 εκ.
Bibliography:	Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο
ISBN:	0780327470 0818670002