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13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey: proceedings /

Corporate Authors:	IEEE VLSI Test Symposium Princeton, N.J.), IEEE Computer Society, IEEE Computer Society. Test Technology Technical Committee, Institution of Electrical and Electronics Engineers. Philadelphia Section
Format:	Book
Language:	English
Published:	Los Alamitos, Calif.: IEEE Computer Society Press, c1995
Subjects:	Integrated circuits > Very large scale integration > Testing

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