Power-constrained testing of VLSI circuits/
| Main Author: | |
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| Corporate Author: | |
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston:
Kluwer Academic Publishers,
c2003
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| Series: | Frontiers in electronic testing
22 |
| Subjects: | |
| Online Access: | http://www.loc.gov/catdir/toc/fy037/2002043306.html |
Internet
http://www.loc.gov/catdir/toc/fy037/2002043306.html| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Δημοκρίτειο Πανεπιστήμιο Θράκης | TK 7874 .75 | 1 | Προβολή | OPAC |