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|q σκληρόδετο
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|a GR-KoDPT
|b gre
|e AACR2
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|a TK7874.75
|b .N53 2003
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| 082 |
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|2 21
|a 621.39/5/0287
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| 100 |
1 |
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|a Nicolici, Nicola
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| 245 |
1 |
0 |
|a Power-constrained testing of VLSI circuits/
|c by Nicola Nicolici and Bashir M. Al-Hashimi
|
| 260 |
|
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|a Boston:
|b Kluwer Academic Publishers,
|c c2003
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| 300 |
|
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|a xi, 178 σ. :
|b εικ. ;
|c 25 εκ.
|
| 490 |
0 |
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|a Frontiers in electronic testing
|v 22
|
| 504 |
|
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|a Περιέχει βιβλιογραφικές παραπομπές (σ. 163-173) και ευρετήριο
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Protection
|
| 650 |
|
0 |
|a Semiconductors
|x Thermal properties
|
| 700 |
1 |
|
|a Al-Hashimi, Bashir
|
| 710 |
|
|
|a Kluwer
|
| 856 |
4 |
0 |
|u http://www.loc.gov/catdir/toc/fy037/2002043306.html
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| 952 |
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|a GR-KoDPT
|b 59cc2ce66c5ad13446fa6eef
|c 998a
|d 945l
|e TK 7874 .75
|t 1
|x m
|z Books
|
