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Power-constrained testing of VLSI circuits/

Main Author:	Nicolici, Nicola
Corporate Author:	Kluwer
Other Authors:	Al-Hashimi, Bashir
Format:	Book
Language:	English
Published:	Boston: Kluwer Academic Publishers, c2003
Series:	Frontiers in electronic testing 22
Subjects:	Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration > Protection Semiconductors > Thermal properties
Online Access:	http://www.loc.gov/catdir/toc/fy037/2002043306.html

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