Description: Power-constrained testing of VLSI circuits/

Main Author:	Nicolici, Nicola
Corporate Author:	Kluwer
Other Authors:	Al-Hashimi, Bashir
Format:	Book
Language:	English
Published:	Boston: Kluwer Academic Publishers, c2003
Series:	Frontiers in electronic testing 22
Subjects:	Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration > Protection Semiconductors > Thermal properties
Online Access:	http://www.loc.gov/catdir/toc/fy037/2002043306.html

Physical Description:	xi, 178 σ. : εικ. ; 25 εκ.
Bibliography:	Περιέχει βιβλιογραφικές παραπομπές (σ. 163-173) και ευρετήριο
ISBN:	140207235X