Table of Contents: Principles of semiconductor network testing /

Main Author:	Afshar, Amir.
Format:	Book
Language:	English
Published:	Boston : Butterworth-Heinemann, ©1995.
Subjects:	Integrated circuits > Testing. Semiconductors > Testing. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated. TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Online Access:	http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=205737

Table of Contents:

Front Cover; Principles of Semiconductor Network Testing; Copyright Page; Contents; Foreword; Preface; Chapter 1. Diode and Transistor Operation; Chapter 2. Integrated Circuit Test Basics; Chapter 3. Digital Logic Test; Chapter 4. Noise Identification; Chapter 5. Operational Amplifier; Chapter 6. Data Acquisition Devices; Chapter 7. Digital Signal Processing; Chapter 8. CODEC (Coder/Decoder); Index.