Assessing fault model and test quality/
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston:
Kluwer Academic,
c1992
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| Series: | The Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing
SECS 157 |
| Subjects: |
| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου | TK7874.B85 1992 | 1 | Προβολή | OPAC |