Cover Image

A unified approach for timing verification and delay fault testing/

Main Author:	Sivaraman, Mukund, 1970-
Other Authors:	Strojwas, Andrzej J.
Format:	Book
Language:	English
Published:	Boston: Kluwer Academic, [c1998]
Subjects:	Digital integrated circuits > Design and construction > Data processing Digital integrated circuits > Testing Delay faults (Semiconductors) Integrated circuits > Verification

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