Description: A unified approach for timing verification and delay fault testing/

Main Author:	Sivaraman, Mukund, 1970-
Other Authors:	Strojwas, Andrzej J.
Format:	Book
Language:	English
Published:	Boston: Kluwer Academic, [c1998]
Subjects:	Digital integrated circuits > Design and construction > Data processing Digital integrated circuits > Testing Delay faults (Semiconductors) Integrated circuits > Verification

Physical Description:	xv, 155 p. : ill. ; 25 cm.
Bibliography:	Includes bibliographical references (p. [139]-152) and index.
ISBN:	0792380797 9780792380795