VLSI fault modeling and testing techniques/

Other Authors:	Zobrist, George W.
Format:	Book
Language:	English
Published:	Norwood, NJ: Ablex Publication, c1993
Series:	VLSI design automation series
Subjects:	Integrated circuits > Very large scale integration > Testing > Data processing

Similar Items

High quality test pattern generation techniques for digital VLSI circuits/
by: Νεοφύτου, Στέλιος Ν.
Published: (2009)

Modeling and simulation of high speed VLSI interconnects/
Published: (1994)

Unified methods for VLSI simulation and test generation/
by: Cheng, Kwang-Ting, 1961-
Published: (1989)

13th IEEE VLSI Test Symposium : April 30-May 3, 1995, Princeton, New Jersey: proceedings /
Published: (1995)

Introduction to VLSI testing/
by: Feugate, Robert J., 1946-
Published: (1988)

Delay fault testing for VLSI circuits/
by: Krstic, Angela, 1965-
Published: (1998)

VLSI design techniques for analog and digital circuits/
by: Geiger, Randall L.
Published: (1990)

High-level test synthesis of digital VLSI circuits/
by: Lee, Mike Tien-Chien
Published: (1997)

High-level test synthesis of digital VLSI circuits/
by: Lee, Mike Tien-Chien
Published: (1997)

Genetic algorithms for VLSI design, layout & test automation/
by: Mazumder, Pinaki
Published: (1999)

VLSI reliability/
by: Sabnis, Anant G.
Published: (1990)

CAD for VLSI /
Published: (1985)

VLSI engineering/
by: Dillinger, Thomas E., 1956-
Published: (1988)

VLSI technology/
Published: (2003)

VLSI design/
by: Vai, M. Michael
Published: (2001)

The VLSI handbook/
Published: (2000)

Power-constrained testing of VLSI circuits/
by: Nicolici, Nicola
Published: (2003)

Analog VLSI: circuits and principles/
Published: (2002)

Tutorial test generation for VLSI chips/
Published: (1988)

Silicon processing for the VLSI era/
by: Wolf, Stanley, 1943-
Published: (1986)

VLSI circuits for biomedical applications
Published: (2008)

Analog VLSI design automation/
by: Balkir, Sina
Published: (2003)

Mixed analog-digital VLSI devices and technology/
by: Τσιβίδης, Γιάννης
Published: (2002)

Mixed analog-digital VLSI devices and technology
by: Tsividis, Yannis.
Published: (2002)

VLSI-design of non-volatile memories/
by: Campardo, Giovanni
Published: (2005)

Symbolic analysis and reduction of VLSI circuits/
by: Qin, Zhanhai, 1976-
Published: (2005)

VLSI circuits and systems : 19-21 may 2003, Maspalomas, Grand Canaria, Spain /
Published: (2003)

Sixteenth Conference on Advanced Research in VLSI : proceedings, March 27-29, 1995, Chapel Hill, North Carolina /
Published: (1995)

VLSI design environments/
Published: (2000)

Η MOS και CMOS συστήματα VLSI: βασικές αρχές σχεδιασμού και κατασκευής/
by: Τσαλίδης, Φίλιππος Γ.
Published: (1989)

VLSI testing & validation techniques/
by: Reghbati, Hassan K., 1949-
Published: (1985)

VLSI testing: digital and mixed analogue/digital techniques/
by: Hurst, S. L.
Published: (1998)

VLSI design techniques for analog and digital circuits /
by: Geiger, Randall L.
Published: (1990)

VLSI technology /
Published: (1988)

Path delay fault testing for digital VLSI circuits using specialized binary decision diagrams/
by: Χρίστου, Κυριάκος Α.
Published: (2012)

Advanced simulation and test methodologies for VLSI design/
by: Russell, G.
Published: (1989)

Principles of CMOS VLSI design: a systems perspective/
by: Weste, Neil H. E.
Published: (1993)

VLSI physical design automation : theory and practice /
by: Sait, Sadiq M., 1957-
Published: (1995)

Introduction to VLSI technology /
by: Price, T. E.
Published: (1994)

Digital circuit testing and testability/
by: Lala, Parag K., 1948-
Published: (1997)

Cannot write session to /tmp/vufind_sessions/sess_oekkgr7b5u91iq3pmlfrdoolf2