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| LEADER |
00768nam a2200193 a 4500 |
| 001 |
1541489 |
| 005 |
20171111233630.0 |
| 008 |
060921s1993 cy da r 000 u eng d |
| 020 |
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|a 0893917818
|q hbk.
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| 040 |
|
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|a CY
|b University of Cyprus
|e AACR2
|
| 050 |
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|a TK7874.V5625 1993
|
| 245 |
1 |
0 |
|a VLSI fault modeling and testing techniques/
|c edited by George W. Zobrist
|
| 260 |
|
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|a Norwood, NJ:
|b Ablex Publication,
|c c1993
|
| 300 |
|
|
|a vii, 199 p. :
|b ill. ;
|c 23 cm.
|
| 490 |
0 |
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|a VLSI design automation series
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| 504 |
|
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|a Includes bibliographical references and indexes.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing
|x Data processing
|
| 700 |
1 |
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|a Zobrist, George W.
|
| 952 |
|
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|a CY-NiOUC
|b 5a042fd56c5ad14ac1e8ad56
|c 998a
|d 945l
|e TK7874.V5625 1993
|t 1
|x m
|z Books
|
