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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

Corporate Authors:	International Symposium for Testing and Failure Analysis Portland, Or.), ASM International., Electronic Device Failure Analysis Society.
Format:	Book
Language:	English
Published:	Thirty-fourth International Symposium for Testing and Failure Analysis Materials Park, OH : Asm International, c2008.
Subjects:	Electronics > Materials > Testing Electronic apparatus and appliances > Testing
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10320212

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