ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

Corporate Authors: International Symposium for Testing and Failure Analysis Boston, Mass.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Materials Park, OH : ASM International, c2004.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10328960

Internet

http://site.ebrary.com/lib/ucy/Doc?id=10328960
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