ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

Corporate Authors: International Symposium for Testing and Failure Analysis Santa Clara, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Conference Proceedings from the 25th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c1999.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10323467

Internet

http://site.ebrary.com/lib/ucy/Doc?id=10323467
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