ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Corporate Authors: International Symposium for Testing and Failure Analysis Santa Clara, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c2001.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10320377

Internet

http://site.ebrary.com/lib/ucy/Doc?id=10320377
ΒιβλιοθήκηΤαξιθετικός αριθμόςΑριθμός ΑντιτύπωνΠληροφορίεςΚατάσταση
Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου-1ΠροβολήOPAC