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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

Corporate Authors:	International Symposium for Testing and Failure Analysis Santa Clara, Calif.), ASM International., Electronic Device Failure Analysis Society.
Format:	Book
Language:	English
Published:	Conference Proceedings from the 27th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c2001.
Subjects:	Electronics > Materials > Testing Electronic apparatus and appliances > Testing
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10320377

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