ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Corporate Authors: International Symposium for Testing and Failure Analysis Bellevue, Wash.), ASM International., Electronic Device Failure Analysis Society.
Format: Book
Language:English
Published: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c2000.
Subjects:
Online Access:http://site.ebrary.com/lib/ucy/Doc?id=10320364

Internet

http://site.ebrary.com/lib/ucy/Doc?id=10320364
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