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ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Corporate Authors:	International Symposium for Testing and Failure Analysis Bellevue, Wash.), ASM International., Electronic Device Failure Analysis Society.
Format:	Book
Language:	English
Published:	Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis Materials Park, OH : ASM International, c2000.
Subjects:	Electronics > Materials > Testing Electronic apparatus and appliances > Testing
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10320364

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