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01367nam a2200253 a 4500 |
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20171111234529.0 |
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080814s2008 ohua sb 001 0 eng d |
| 020 |
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|z 0871707144
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|a CaPaEBR
|z 9780871707147
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| 050 |
1 |
4 |
|a TK7871
|b .I68 2008eb
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| 111 |
2 |
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|a International Symposium for Testing and Failure Analysis
|c Portland, Or.)
|d 2008 :
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|a 34th International Symposium for Testing and Failure Analysis
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| 245 |
1 |
0 |
|a ISTFA 2008
|b conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
|c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.
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3 |
0 |
|a 34th International Symposium for Testing and Failure Analysis
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| 260 |
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|a Thirty-fourth International Symposium for Testing and Failure Analysis
|b Asm International,
|c c2008.
|a Materials Park, OH :
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| 300 |
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|a xx, 528 p. :
|b ill.
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| 504 |
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|a Includes bibliographical references and index.
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| 650 |
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0 |
|a Electronics
|x Materials
|x Testing
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing
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| 710 |
2 |
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|a ASM International.
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| 710 |
2 |
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|a Electronic Device Failure Analysis Society.
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| 856 |
4 |
0 |
|a ebrary, Inc.
|u http://site.ebrary.com/lib/ucy/Doc?id=10320212
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| 952 |
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|a CY-NiOUC
|b 5a0456f36c5ad14ac1ece815
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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