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Microelectronic failure analysis desk reference.

Corporate Author:	Electronic Device Failure Analysis Society.
Format:	Book
Language:	English
Published:	Materials Park, OH : ASM International, c2002.
Subjects:	Electronic apparatus and appliances > Testing Electronics > Materials > Testing Microelectronics > Materials > Defects Microelectronics > Materials > Testing Semiconductors > Defects
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10330016

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