Description: System-on-chip test architectures:

Other Authors:	Stroud, Charles E., Touba, Nur A.
Format:	Book
Language:	English
Published:	Amsterdam ; Boston: Elsevier/Morgan Kaufmann Publishers, c2008
Series:	The Morgan Kaufmann series in systems on silicon
Subjects:	Systems on a chip > Testing Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration

Physical Description:	xxxvi, 856 p. : ill. ; 29 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	9780123739735 012373973X