Stroud, C. E., & Touba, N. A. (2008). System-on-chip test architectures: Nanometer design for testability. Amsterdam ; Boston: Elsevier/Morgan Kaufmann Publishers.
Chicago Style CitationStroud, Charles E., and Nur A. Touba. System-on-chip Test Architectures: Nanometer Design for Testability. Amsterdam ; Boston: Elsevier/Morgan Kaufmann Publishers, 2008.
MLA CitationStroud, Charles E., and Nur A. Touba. System-on-chip Test Architectures: Nanometer Design for Testability. Amsterdam ; Boston: Elsevier/Morgan Kaufmann Publishers, 2008.
Warning: These citations may not always be 100% accurate.