Description: International Test Conference 1996:

Corporate Authors:	IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers
Format:	Book
Language:	English
Published:	Altoona: International Test Conference, 1996
Subjects:	Integrated circuits > Testing > Congresses Electronic digital computers > Circuits > Testing > Congresses Integrated circuits > Fault tolerance

Item Description:	Σημείωση στο εξώφυλλο : October 20-25, 1996, Sheraton Washington Hotel, Washington, D.C., USA
Physical Description:	xii, 951σ. : εικ.
Bibliography:	Περιέχει βιβλιογραφία και ευρετήριο
ISBN:	0780335406