Holdings: International Test Conference 1996:

Corporate Authors:	IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers
Format:	Book
Language:	English
Published:	Altoona: International Test Conference, 1996
Subjects:	Integrated circuits > Testing > Congresses Electronic digital computers > Circuits > Testing > Congresses Integrated circuits > Fault tolerance

Βιβλιοθήκη	Ταξιθετικός αριθμός	Αριθμός Αντιτύπων	Πληροφορίες	Κατάσταση
ΤΕΙ Ανατολικής Μακεδονίας & Θράκης	621.3815 INT	2	Προβολή	OPAC