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X-ray microscopy and spectromicroscopy : statue report from the fifth international conference, Wόrzburg, August 19-23, 1996 /

Corporate Author:	International Conference of X-Ray Microscopy and Spectromicroscopy
Other Authors:	Thieme, Jόrgen
Format:	Book
Language:	English
Published:	Berlin ; Springer , c1998 . New York :
Subjects:	X-ray microscopy > Congresses

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