X-ray microscopy and spectromicroscopy : statue report from the fifth international conference, Wόrzburg, August 19-23, 1996 /

Corporate Author: International Conference of X-Ray Microscopy and Spectromicroscopy
Other Authors: Thieme, Jόrgen
Format: Book
Language:English
Published: Berlin ; Springer , c1998 .
New York :
Subjects:

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