X-ray microscopy and spectromicroscopy : statue report from the fifth international conference, Wόrzburg, August 19-23, 1996 /
Corporate Author: | International Conference of X-Ray Microscopy and Spectromicroscopy |
---|---|
Other Authors: | Thieme, Jόrgen |
Format: | Book |
Language: | English |
Published: |
Berlin ;
Springer ,
c1998 .
New York : |
Subjects: |
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