X-ray microscopy and spectromicroscopy : statue report from the fifth international conference, Wόrzburg, August 19-23, 1996 /

Corporate Author: International Conference of X-Ray Microscopy and Spectromicroscopy
Other Authors: Thieme, Jόrgen
Format: Book
Language:English
Published: Berlin ; Springer , c1998 .
New York :
Subjects:
Item Description:Based on presentation to the International Conference of X-Ray Microscopy and Spectromicroscopy, XRM 96, which took place in Wόrzburg, August 19-23, 1996.
Physical Description:1 v. (various pagings) : ill. ; 25 cm. + 1 computer laser optical disc (4 3/4 in.)
ISBN:3540639985(hard:alk.paper)