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01075nam a2200241 a 4500 |
| 001 |
1834772 |
| 005 |
20171111234619.0 |
| 008 |
070604s2008 ne a sb 001 0 eng |
| 020 |
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|z 9780123739735 (hardcover : alk. paper)
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| 040 |
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|a CaPaEBR
|z 012373973X (hardcover : alk. paper)
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| 050 |
1 |
4 |
|a TK7895.E42
|b S978 2008eb
|
| 245 |
0 |
0 |
|a System-on-chip test architectures
|b nanometer design for testability /
|c edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
|
| 260 |
|
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|a Amsterdam ;
|b Morgan Kaufmann Publishers,
|c c2008.
|a Boston :
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| 300 |
|
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|a xxxvi, 856 p. :
|b ill.
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| 490 |
1 |
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|a The Morgan Kaufmann series in systems on silicon
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| 504 |
|
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|a Includes bibliographical references and index.
|
| 650 |
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0 |
|a Systems on a chip
|x Testing.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|
| 700 |
1 |
|
|a Stroud, Charles E.
|x Design.
|
| 710 |
2 |
|
|a ebrary, Inc.
|
| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10203465
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| 952 |
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|a CY-NiOUC
|b 5a045e196c5ad14ac1edc12a
|c 998a
|d 945l
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|z Books
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