Wafer-level testing and test during burn-in for integrated circuits
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| Format: | Book |
| Language: | English |
| Published: |
Boston :
Artech House,
2010.
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| Series: | Artech House integrated microsystems series
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| Online Access: | http://site.ebrary.com/lib/ucy/Doc?id=10412729 |
Internet
http://site.ebrary.com/lib/ucy/Doc?id=10412729| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου | - | 1 | Προβολή | OPAC |