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| LEADER |
00968nam a2200253 a 4500 |
| 001 |
1809018 |
| 005 |
20171111234554.0 |
| 008 |
091005s2010 maua sb 001 0 eng d |
| 020 |
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|z 9781596939899
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| 040 |
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|a CaPaEBR
|z 1596939893
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| 050 |
1 |
4 |
|a TK7874
|b .B35 2010eb
|
| 100 |
1 |
|
|a Bahukudumbi, Sudarshan.
|
| 245 |
1 |
0 |
|a Wafer-level testing and test during burn-in for integrated circuits
|c Sudarshan Bahukudumbi, Krishnendu Chakrabarty.
|
| 260 |
|
|
|a Boston :
|b Artech House,
|c 2010.
|
| 300 |
|
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|a xv, 198 p. :
|b ill.
|
| 490 |
1 |
|
|a Artech House integrated microsystems series
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing.
|
| 650 |
|
0 |
|a Integrated circuits
|x Wafer-scale integration.
|
| 650 |
|
0 |
|a Semiconductors
|x Testing.
|
| 700 |
1 |
|
|a Chakrabarty, Krishnendu.
|
| 710 |
2 |
|
|a ebrary, Inc.
|
| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10412729
|
| 952 |
|
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|a CY-NiOUC
|b 5a045aae6c5ad14ac1ed5749
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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