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040626s2002 nyua gsb 001 0 eng d |
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|a CaPaEBR
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1 |
4 |
|a TK7874.75
|b .B87 2002eb
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| 100 |
1 |
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|a Bushnell, Michael L.
|d 1950-
|q (Michael Lee),
|
| 245 |
1 |
0 |
|a Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits
|c Michael L. Bushnell, Vishwani D. Agrawal.
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| 260 |
|
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|a New York :
|b Kluwer Academic,
|c c2002.
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| 300 |
|
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|a xviii, 690 p. :
|b ill.
|
| 490 |
1 |
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|a Frontiers in electronic testing ;
|v 17
|
| 504 |
|
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|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|
| 650 |
|
0 |
|a Digital integrated circuits
|x Testing.
|
| 650 |
|
0 |
|a Mixed signal circuits
|x Testing.
|
| 650 |
|
0 |
|a Semiconductor storage devices
|x Testing.
|
| 700 |
1 |
|
|a Agrawal, Vishwani D.,
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| 710 |
2 |
|
|a ebrary, Inc.
|
| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10053265
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| 952 |
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|a CY-NiOUC
|b 5a0457a36c5ad14ac1ecfc78
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
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