Description: Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits

Main Author:	Bushnell, Michael L. 1950-
Corporate Author:	ebrary, Inc.
Other Authors:	Agrawal, Vishwani D.,
Format:	Book
Language:	English
Published:	New York : Kluwer Academic, c2002.
Series:	Frontiers in electronic testing ; 17
Subjects:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10053265

Physical Description:	xviii, 690 p. : ill.
Bibliography:	Includes bibliographical references and index.