Path delay fault testing for digital VLSI circuits using specialized binary decision diagrams/

Main Author: Χρίστου, Κυριάκος Α.
Format: Book
Language:English
Published: Nicosia: [s. n.], 2012
Subjects:
Item Description:Supervisor Maria K. Michael.
Physical Description:xviii, 157 p. : col. ill., tables ; 31 cm.
Bibliography:Includes bibliography (p. 150-157).