Path delay fault testing for digital VLSI circuits using specialized binary decision diagrams/
Main Author: | |
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Format: | Book |
Language: | English |
Published: |
Nicosia:
[s. n.],
2012
|
Subjects: |
Item Description: | Supervisor Maria K. Michael. |
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Physical Description: | xviii, 157 p. : col. ill., tables ; 31 cm. |
Bibliography: | Includes bibliography (p. 150-157). |