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00801nam a2200205 a 4500 |
| 001 |
2050498 |
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20171112000053.0 |
| 008 |
050808s1998 cy da r 000 u eng d |
| 020 |
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|a 0824701828
|q hbk.
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| 040 |
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|a CY
|b University of Cyprus
|e AACR2
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| 050 |
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|a TK7874.D365 1998
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| 050 |
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|a TK7874.D365 1998
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| 100 |
1 |
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|a David, Rene,
|d 1939-
|
| 245 |
1 |
0 |
|a Random testing of digital circuits:
|b theory and applications/
|c Rene David
|
| 260 |
1 |
0 |
|a New York:
|b Marcel Dekker,
|c c1998
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| 300 |
1 |
0 |
|a xix, 475 p. :
|b ill. ;
|c 24 cm.
|
| 504 |
1 |
0 |
|a Includes bibliography (p. 447-461) and index.
|
| 650 |
1 |
0 |
|a Digital integrated circuits
|x Testing
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| 952 |
|
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|a GRHeTEI
|b 59ccc6cb6c5ad13446085641
|c 998a
|d 945l
|e TK7874 .D365 1998
|t 1
|x m
|z Books
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| 952 |
|
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|a CY-NiOUC
|b 5a042cda6c5ad14ac1e859ee
|c 998a
|d 945l
|e TK7874.D365 1998
|t 1
|x m
|z Books
|
