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Random testing of digital circuits: theory and applications/

Main Author: David, Rene, 1939-
Format: Book
Language:English
Published: New York: Marcel Dekker, c1998
Subjects:
Digital integrated circuits > Testing
Physical Description:xix, 475 p. : ill. ; 24 cm.
Bibliography:Includes bibliography (p. 447-461) and index.
ISBN:0824701828

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