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01094nam a2200289 a 4500 |
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1935378 |
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20171111235813.0 |
| 008 |
990701s1995 gr r 000 0 eng d |
| 020 |
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|a 0750694726
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| 040 |
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|a GR-KoDPT
|b gre
|e AACR2
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| 050 |
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|a TK7874
|b .A339 1995
|a TK7874
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| 050 |
1 |
4 |
|a TK7874
|b .A339 1995
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| 082 |
1 |
0 |
|2 20
|a 621.3815/48
|b .A339 1995
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| 082 |
0 |
0 |
|2 20
|a 621.3815/48
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| 100 |
1 |
0 |
|a Afshar, Amir
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| 245 |
0 |
0 |
|a Principles of semiconductor network testing/
|c Amir Afshar
|
| 260 |
0 |
0 |
|a Boston:
|b Butterworth-Heinemann,
|c c1995
|
| 300 |
0 |
0 |
|a xiv, 213 σ. :
|b εικ. ;
|c 25 εκ.
|
| 504 |
0 |
0 |
|a Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο
|
| 504 |
0 |
0 |
|a Includes bibliographical references and index.
|
| 650 |
0 |
0 |
|a Integrated circuits
|x Testing
|
| 650 |
0 |
0 |
|a Semiconductors
|x Testing
|
| 650 |
0 |
0 |
|a Integrated circuits
|x Testing
|
| 650 |
0 |
0 |
|a Semiconductors
|x Testing
|
| 710 |
0 |
0 |
|a Butterworth-Heinemann
|
| 952 |
|
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|a GR-KoDPT
|b 59cc33e16c5ad13446fb0f8f
|c 998a
|d 945l
|e TK 787
|t 1
|x m
|z Books
|
| 952 |
|
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|a GR-AtTEI
|b 59cc82706c5ad13446fde092
|c 998a
|d 945l
|x m
|z Books
|
