Principles of semiconductor network testing/

Main Author: Afshar, Amir
Corporate Author: Butterworth-Heinemann
Format: Book
Language:English
Published: Boston: Butterworth-Heinemann, c1995
Subjects:
Physical Description:xiv, 213 σ. : εικ. ; 25 εκ.
Bibliography:Περιέχει βιβλιογραφικές παραπομπές και ευρετήριο
Includes bibliographical references and index.
ISBN:0750694726