Beam effects, surface topography, and depth profiling in surface analysis
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Plenum Press,
c1998.
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| Series: | Methods of surface characterization ;
v. 5 |
| Subjects: | |
| Online Access: | http://site.ebrary.com/lib/ucy/Doc?id=10046976 |