Description: Beam effects, surface topography, and depth profiling in surface analysis

Corporate Author:	ebrary, Inc.
Other Authors:	Madey, Theodore E.
Format:	Book
Language:	English
Published:	New York : Plenum Press, c1998.
Series:	Methods of surface characterization ; v. 5
Subjects:	Surfaces (Technology) > Analysis. Materials > Effect of radiation on.
Online Access:	http://site.ebrary.com/lib/ucy/Doc?id=10046976

Physical Description:	xix, 430 p. : ill.
Bibliography:	Includes bibliographical references and index.