|
|
|
|
| LEADER |
00893nam a2200229 a 4500 |
| 001 |
1790373 |
| 005 |
20171111234537.0 |
| 008 |
980811s1998 nyua sb 001 0 eng |
| 020 |
|
|
|z 0306458969
|
| 040 |
|
|
|a CaPaEBR
|
| 050 |
1 |
4 |
|a TA418.7
|b .B43 1998eb
|
| 245 |
0 |
0 |
|a Beam effects, surface topography, and depth profiling in surface analysis
|c edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
|
| 260 |
|
|
|a New York :
|b Plenum Press,
|c c1998.
|
| 300 |
|
|
|a xix, 430 p. :
|b ill.
|
| 490 |
1 |
|
|a Methods of surface characterization ;
|v v. 5
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 650 |
|
0 |
|a Surfaces (Technology)
|x Analysis.
|
| 650 |
|
0 |
|a Materials
|x Effect of radiation on.
|
| 700 |
1 |
|
|a Madey, Theodore E.
|
| 710 |
2 |
|
|a ebrary, Inc.
|
| 856 |
4 |
0 |
|u http://site.ebrary.com/lib/ucy/Doc?id=10046976
|
| 952 |
|
|
|a CY-NiOUC
|b 5a0458166c5ad14ac1ed09fc
|c 998a
|d 945l
|e -
|t 1
|x m
|z Books
|
