Defect and fault tolerance in VLSI systems/

Corporate Author: International Workshop on Defect and Fault Tolerance in VLSI Systems
Other Authors: Koren, Israel
Format: Book
Language:English
Published: New York: Plenum Press, c1989-
Subjects:
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040 |a CY  |b University of Cyprus  |e AACR2 
050 |a TK7874.D415 
245 1 0 |a Defect and fault tolerance in VLSI systems/  |c edited by Israel Koren 
260 |a New York:  |b Plenum Press,  |c c1989- 
300 |a v. :  |b ill. ;  |c 26 cm. 
500 |a "Proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 6-7, 1988, in Springfield, Massachusetts"--T.p. verso. 
504 |a Includes bibliographies and index. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design and construction  |x Congresses 
650 0 |a Fault-tolerant computing  |x Congresses 
700 1 |a Koren, Israel  
711 2 |a International Workshop on Defect and Fault Tolerance in VLSI Systems  |d (1988 : 
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