Holdings: Defect and fault tolerance in VLSI systems/

Corporate Author:	International Workshop on Defect and Fault Tolerance in VLSI Systems
Other Authors:	Koren, Israel
Format:	Book
Language:	English
Published:	New York: Plenum Press, c1989-
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses Fault-tolerant computing > Congresses

Βιβλιοθήκη	Ταξιθετικός αριθμός	Αριθμός Αντιτύπων	Πληροφορίες	Κατάσταση
Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου	TK7874.D415	2	Προβολή	OPAC