Description: Defect and fault tolerance in VLSI systems/

Corporate Author:	International Workshop on Defect and Fault Tolerance in VLSI Systems
Other Authors:	Koren, Israel
Format:	Book
Language:	English
Published:	New York: Plenum Press, c1989-
Subjects:	Integrated circuits > Very large scale integration > Design and construction > Congresses Fault-tolerant computing > Congresses

Item Description:	"Proceedings of the International Workshop on Defect and Fault Tolerance in VLSI Systems, held October 6-7, 1988, in Springfield, Massachusetts"--T.p. verso.
Physical Description:	v. : ill. ; 26 cm.
Bibliography:	Includes bibliographies and index.
ISBN:	0306432242 0306435314