Description: Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits/

Main Author:	Bushnell, Michael L., 1950-
Other Authors:	Agrawal, Vishwani D.,
Format:	Book
Language:	English
Published:	Boston: Kluwer Academic, 2004, c2000
Series:	Frontiers in electronic testing 17
Subjects:	Integrated circuits > Very large scale integration > Testing Digital integrated circuits > Testing Mixed signal circuits > Testing Semiconductor storage devices > Testing

Physical Description:	xviii, 690 p. : ill. ; 26 cm.
Bibliography:	Includes bibliographical references (p. [631]-670) and index.
ISBN:	0792379918