Ion beam surface layer analysis: proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation/
Corporate Authors: | International Conference on Ion Beam Surface Layer Analysis Yorktown Heights, N.Y.), National Science Foundation (U.S.), International Business Machines Corporation |
---|---|
Other Authors: | Mayer, J. W., Ziegler, James F. |
Format: | Book |
Language: | English |
Published: |
Lausanne:
Elsevier Sequoia S.A.,
1974
|
Subjects: |
Similar Items
-
Organic thin films and surfaces: directions for the nineties/
Published: (1995) -
Introduction to surface and thin film processes /
by: Venables, John, 1936-
Published: (2000) -
Low energy ion assisted film growth
by: Gonzβalez-Elipe, A. R.
Published: (2003) -
Thin film micro-optics new frontiers of spatio-temporal beam shaping /
by: Grunwald, Ruediger.
Published: (2007) -
Thin film phenomena/
by: Chopra, Kasturi L., 1933-
Published: (1969)