Ion beam surface layer analysis: proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation/
| Corporate Authors: | , , |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Lausanne:
Elsevier Sequoia S.A.,
1974
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| Subjects: |
| Βιβλιοθήκη | Ταξιθετικός αριθμός | Αριθμός Αντιτύπων | Πληροφορίες | Κατάσταση |
|---|---|---|---|---|
| Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου | QC176.82.I55 1973 | 1 | Προβολή | OPAC |