Holdings: Nanostructure science, metrology, and technology:

Corporate Authors:	Society of Photo-optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.), United States. Office of Naval Research
Other Authors:	Peckerar, Martin Charles ,, Postek, Michael T.
Format:	Book
Language:	English
Published:	Bellingham, Wash.: SPIE-the International Society for Optical Engineering, c2002
Series:	SPIE proceedings series 4608
Subjects:	Nanotechnology > Congresses Nanostructures > Congresses Metrology > Congresses Microelectronics > Congresses

Βιβλιοθήκη	Ταξιθετικός αριθμός	Αριθμός Αντιτύπων	Πληροφορίες	Κατάσταση
Πανεπιστήμιο Κύπρου - Ανοιχτό Πανεπιστήμιο Κύπρου	T174.7.N359 2002	1	Προβολή	OPAC