Precision landmark location for machine vision and photogrammetry : finding and achieving the maximum possible accuracy /
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| Format: | Book |
| Language: | English |
| Published: |
London :
Springer,
c2008.
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| Online Access: | http://www.loc.gov/catdir/toc/fy0803/2007936782.html http://dx.doi.org/10.1007/978-1-84628-913-2 |